FATEVNT

Bulk Data Entry Defines loading events for fatigue analysis.

Format

(1)	(2)	(3)	(4)	(5)	(6)	(7)	(8)	(9)	(10)
FATEVNT	`ID`	`FLOAD1`	`FLOAD2`	`FLOAD3`	`FLOAD4`	`FLOAD5`	`FLOAD6`	`FLOAD7`
		`FLOAD8`	etc	etc	`SQNTL`

Field	Contents	SI Unit Example
`ID`	Each FATEVNT card must have a unique ID. This identifier may be referenced by a FATSEQ definition. No default (Integer > 0)
`FLOAD#`	A FATLOAD entry identification number. 1 3 No default (Integer > 0)
`SQNTL`	Flag to switch applied FATLOAD’s to sequential loading. SQNTL If present at the end of the `FLOAD#` list, then the FATLOAD’s are applied sequentially as if the individual loads are separate time steps. The location of this field is not fixed; this flag can be specified in the field next to the final `FLOAD#`. If `SQNTL` flag is present, the `TID` field on the corresponding FATLOAD entries should be blank. 5 Blank (Default) The FATLOAD’s are not applied sequentially and are superimposed. This is the default behavior.

FATLOAD entries referenced on this Bulk Data Entry may reference different subcases.
Identification numbers of FATSEQ and FATEVNT share the same ID pool.
Typically, the referenced FATLOAD entries can reference only the same subcase type on the same FATEVNT entry. For example, either static subcases or transient subcases can be referenced, but not both. Referencing a combination of subcase types using FATLOAD entries on the same FATEVNT entry is typically not allowed, except for the following applications:
- Sine-on-Random Fatigue Analysis: On the same FATEVNT, referenced FATLOADs can point to random response subcase and frequency response subcase.
- Sine-Sweep on Random Fatigue Analysis: On the same FATEVNT, referenced FATLOADs can point to random response subcase and frequency response subcase.
Multiple Fatigue events are parallelized if SMP parallelization is used (for example, using -nt run option).
SQNTL field is only supported for Static Fatigue. When SQNTL is not present, for all FATLOADs referenced in FATEVNT, the load histories from corresponding TABFATs are used to determine Stress histories for each FATLOAD and are subsequently superimposed to generate the final stress history for each fatigue event. If SQNTL flag is present, the TID field on the corresponding FATLOAD entries should be blank. Each FATLOAD now will directly be considered as a point in the final stress history.
This card is represented as a load collector in HyperMesh.